IRIS publication 277991528
Reliability analysis of logic circuits using probabilistic techniques
RIS format for Endnote and similar
TY - CONF - Grandhi, Satish and Spagnol, Christian and Popovici, Emanuel - Microelectronics and Electronics (PRIME), 2014 10th Conference on Ph. D. Research in - Reliability analysis of logic circuits using probabilistic techniques - 2014 - January - Validated - () - 1 - 4 DA - 2014/01 ER -
BIBTeX format for JabRef and similar
@inproceedings{V277991528, = {Grandhi, Satish and Spagnol, Christian and Popovici, Emanuel}, = {Microelectronics and Electronics (PRIME), 2014 10th Conference on Ph. D. Research in}, = {{Reliability analysis of logic circuits using probabilistic techniques}}, = {2014}, = {January}, = {Validated}, = {()}, pages = {1--4}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Grandhi, Satish and Spagnol, Christian and Popovici, Emanuel | ||
TITLE | Microelectronics and Electronics (PRIME), 2014 10th Conference on Ph. D. Research in | ||
PUBLICATION_NAME | Reliability analysis of logic circuits using probabilistic techniques | ||
YEAR | 2014 | ||
MONTH | January | ||
STATUS | Validated | ||
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START_PAGE | 1 | ||
END_PAGE | 4 | ||
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