TY  - CONF
  - Grandhi, Satish and Spagnol, Christian and Popovici, Emanuel
  - Microelectronics and Electronics (PRIME), 2014 10th Conference on Ph. D. Research in
  - Reliability analysis of logic circuits using probabilistic techniques
  - 2014
  - January
  - Validated
  - ()
  - 1
  - 4
DA  - 2014/01
ER  - 

@inproceedings{V277991528,
   = {Grandhi, Satish and Spagnol, Christian and Popovici, Emanuel},
   = {Microelectronics and Electronics (PRIME), 2014 10th Conference on Ph. D. Research in},
   = {{Reliability analysis of logic circuits using probabilistic techniques}},
   = {2014},
   = {January},
   = {Validated},
   = {()},
  pages = {1--4},
  source = {IRIS}
}