IRIS publication 26999526
¿Advanced Test Structure Design for Dielectric Characterization of High-K Material¿
RIS format for Endnote and similar
TY - CONF - O¿Sullivan, J.A., Chen, W., McCarthy, K.G., Crean, G.M - IEEE International Conference on Microelectronic Test Structures - ¿Advanced Test Structure Design for Dielectric Characterization of High-K Material¿ - 2008 - March - Validated - 1 - () - 180 - 184 - 24-FEB-07 - 25-FEB-07 DA - 2008/03 ER -
BIBTeX format for JabRef and similar
@inproceedings{V26999526, = {O¿Sullivan, J.A. and Chen, W. and McCarthy, K.G. and Crean, G.M }, = {IEEE International Conference on Microelectronic Test Structures}, = {{¿Advanced Test Structure Design for Dielectric Characterization of High-K Material¿}}, = {2008}, = {March}, = {Validated}, = {1}, = {()}, pages = {180--184}, month = {Feb}, = {25-FEB-07}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | O¿Sullivan, J.A., Chen, W., McCarthy, K.G., Crean, G.M | ||
TITLE | IEEE International Conference on Microelectronic Test Structures | ||
PUBLICATION_NAME | ¿Advanced Test Structure Design for Dielectric Characterization of High-K Material¿ | ||
YEAR | 2008 | ||
MONTH | March | ||
STATUS | Validated | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
SEARCH_KEYWORD | |||
EDITORS | |||
START_PAGE | 180 | ||
END_PAGE | 184 | ||
LOCATION | |||
START_DATE | 24-FEB-07 | ||
END_DATE | 25-FEB-07 | ||
ABSTRACT | |||
FUNDED_BY | |||
URL | |||
DOI_LINK | |||
FUNDING_BODY | |||
GRANT_DETAILS |