¿Minimization of Via Count in Multiple-Metal Inductors: Performance Characterization and Physical Modelling¿.

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TY  - CONF
  - Murphy, O.H., McCarthy, K.G., Murphy, P.J
  - IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
  - ¿Minimization of Via Count in Multiple-Metal Inductors: Performance Characterization and Physical Modelling¿.
  - 2006
  - June
  - Validated
  - 1
  - ()
  - 541
  - 544
  - 11-JUN-06
  - 13-JUN-06
DA  - 2006/06
ER  - 
@inproceedings{V26999535,
   = {Murphy,  O.H. and  McCarthy,  K.G. and  Murphy,  P.J },
   = {IEEE Radio Frequency Integrated Circuits (RFIC) Symposium},
   = {{¿Minimization of Via Count in Multiple-Metal Inductors: Performance Characterization and Physical Modelling¿.}},
   = {2006},
   = {June},
   = {Validated},
   = {1},
   = {()},
  pages = {541--544},
  month = {Jun},
   = {13-JUN-06},
  source = {IRIS}
}
AUTHORSMurphy, O.H., McCarthy, K.G., Murphy, P.J
TITLEIEEE Radio Frequency Integrated Circuits (RFIC) Symposium
PUBLICATION_NAME¿Minimization of Via Count in Multiple-Metal Inductors: Performance Characterization and Physical Modelling¿.
YEAR2006
MONTHJune
STATUSValidated
PEER_REVIEW1
TIMES_CITED()
SEARCH_KEYWORD
EDITORS
START_PAGE541
END_PAGE544
LOCATION
START_DATE11-JUN-06
END_DATE13-JUN-06
ABSTRACT
FUNDED_BY
URL
DOI_LINK
FUNDING_BODY
GRANT_DETAILS