IRIS publication 275945479
Electrical characterization of novel PMNT thin-films
RIS format for Endnote and similar
TY - CONF - Chen, Wenbin and McCarthy, KG and Copuroglu, M and O'Brien, S and Winfield, R and Mathewson, A - Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on - Electrical characterization of novel PMNT thin-films - 2010 - January - Validated - () - 98 - 101 DA - 2010/01 ER -
BIBTeX format for JabRef and similar
@inproceedings{V275945479, = {Chen, Wenbin and McCarthy, KG and Copuroglu, M and O'Brien, S and Winfield, R and Mathewson, A}, = {Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on}, = {{Electrical characterization of novel PMNT thin-films}}, = {2010}, = {January}, = {Validated}, = {()}, pages = {98--101}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Chen, Wenbin and McCarthy, KG and Copuroglu, M and O'Brien, S and Winfield, R and Mathewson, A | ||
TITLE | Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on | ||
PUBLICATION_NAME | Electrical characterization of novel PMNT thin-films | ||
YEAR | 2010 | ||
MONTH | January | ||
STATUS | Validated | ||
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START_PAGE | 98 | ||
END_PAGE | 101 | ||
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