TY  - JOUR
  - Minehane, S and Healy, S and O'Sullivan, P and McCarthy, K and Mathewson, A and Mason, B
  - 1997
  - January
  - Microelectronics Reliability
  - Direct parameter extraction for hot-carrier reliability simulation
  - Validated
  - 37
  - 10
  - 1437
  - 1440
DA  - 1997/01
ER  - 

@article{V276842143,
   = {Minehane, S and Healy, S and O'Sullivan, P and McCarthy, K and Mathewson, A and Mason, B},
   = {1997},
   = {January},
   = {Microelectronics Reliability},
   = {Direct parameter extraction for hot-carrier reliability simulation},
   = {Validated},
   = {37},
   = {10},
  pages = {1437--1440},
  source = {IRIS}
}