TY  - CONF
  - McCarthy, KG and Saavedra Diaz, EV and Klaassen, DBM and Mathewson, A
  - Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on
  - Statistical characterization of 0.18 $\mu$m low-power CMOS process using efficient parameter extraction
  - 1998
  - January
  - Validated
  - ()
  - 127
  - 131
DA  - 1998/01
ER  - 

@inproceedings{V276842144,
   = {McCarthy, KG and Saavedra Diaz, EV and Klaassen, DBM and Mathewson, A},
   = {Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on},
   = {{Statistical characterization of 0.18 $\mu$m low-power CMOS process using efficient parameter extraction}},
   = {1998},
   = {January},
   = {Validated},
   = {()},
  pages = {127--131},
  source = {IRIS}
}