TY  - JOUR
  - Healy, S.; McCarthy, K.; Mason, B.; Mathewson, A.
  - 0
  - Iee Colloquium (Digest)
  - Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747]
  - Published
  - ()
  - 0.033
  - 13
  - 01/13/07
DA  - 0/NaN
ER  - 

@article{V342886,
   = {Healy, S. and  McCarthy, K. and  Mason, B. and  Mathewson, A.},
   = {0},
   = {Iee Colloquium (Digest)},
   = {Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747]},
   = {Published},
   = {()},
   = {0.033},
  pages = {13--01/13/07},
  source = {IRIS}
}