TY  - JOUR
  - Minehane,S.; Healy,S.; O'Sullivan,P.; McCarthy,K.G.; Mathewson,A.; Mason, B.
  - 1997
  - October
  - Microelectronics and Reliability
  - Direct parameter extraction for hot-carrier reliability simulation
  - Published
  - ()
  - 37
  - 10-11
  - 1437
  - 1440
DA  - 1997/10
ER  - 

@article{V343466,
   = {Minehane,S. and  Healy,S. and  O'Sullivan,P. and  McCarthy,K.G. and  Mathewson,A. and  Mason, B.},
   = {1997},
   = {October},
   = {Microelectronics and Reliability},
   = {Direct parameter extraction for hot-carrier reliability simulation},
   = {Published},
   = {()},
   = {37},
   = {10-11},
  pages = {1437--1440},
  source = {IRIS}
}