TY  - CONF
  - Liang,W.; van Langevelde,R,; McCarthy,K.G.; Klaassen, D.B.M.
  - International Conference on Microelectronic Test Structures (ICMTS 2001)
  - Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications
  - 2001
  - March
  - Published
  - 1
  - ()
  - Hazama,H.; Ohzone,T.
  - 141
  - 145
  - Kobe, Japan
  - 19-MAR-01
  - 22-MAR-01
  - Private/Academic Travel Grant
DA  - 2001/03
ER  - 

@inproceedings{V376024,
   = {Liang,W. and  van Langevelde,R, and  McCarthy,K.G. and  Klaassen, D.B.M.},
   = {International Conference on Microelectronic Test Structures (ICMTS 2001)},
   = {{Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications}},
   = {2001},
   = {March},
   = {Published},
   = {1},
   = {()},
   = {Hazama,H. and  Ohzone,T.},
  pages = {141--145},
   = {Kobe, Japan},
  month = {Mar},
   = {22-MAR-01},
   = {Private/Academic Travel Grant},
  source = {IRIS}
}