TY  - CONF
  - Minehane,S.; McCarthy,K.G.; O'Sullivan,P.; Mathewson,A.
  - European Solid-State Device Research Conference (ESSDERC 2000)
  - Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model
  - 2000
  - September
  - Published
  - 1
  - ()
  - Lane,W.A.; Crean,G.M.; McCabe,F.A.; Grunbacher,H.
  - 616
  - 619
  - Cork, Ireland
  - 11-SEP-00
  - 13-SEP-00
  - N/A
DA  - 2000/09
ER  - 

@inproceedings{V376027,
   = {Minehane,S. and  McCarthy,K.G. and  O'Sullivan,P. and  Mathewson,A.},
   = {European Solid-State Device Research Conference (ESSDERC 2000)},
   = {{Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model}},
   = {2000},
   = {September},
   = {Published},
   = {1},
   = {()},
   = {Lane,W.A. and  Crean,G.M. and  McCabe,F.A. and  Grunbacher,H.},
  pages = {616--619},
   = {Cork, Ireland},
  month = {Sep},
   = {13-SEP-00},
   = {N/A},
  source = {IRIS}
}