TY  - CONF
  - McCarthy, K.G.; Saavedra Diaz,E.V.; Klaassen,D.B.M.; Mathewson,A.
  - International Conference on Microelectronic Test Structures (ICMTS 1998)
  - Statistical Characterization and Analysis of 0.18um Low-Power CMOS Process using Efficient Parameter Extraction
  - 1998
  - March
  - Published
  - 1
  - ()
  - Koyama,H,; Asada,K.
  - 127
  - 131
  - Kanazawa, Japan
  - 23-MAR-98
  - 26-MAR-98
  - Research Grant
DA  - 1998/03
ER  - 

@inproceedings{V376122,
   = {McCarthy, K.G. and  Saavedra Diaz,E.V. and  Klaassen,D.B.M. and  Mathewson,A.},
   = {International Conference on Microelectronic Test Structures (ICMTS 1998)},
   = {{Statistical Characterization and Analysis of 0.18um Low-Power CMOS Process using Efficient Parameter Extraction}},
   = {1998},
   = {March},
   = {Published},
   = {1},
   = {()},
   = {Koyama,H, and  Asada,K.},
  pages = {127--131},
   = {Kanazawa, Japan},
  month = {Mar},
   = {26-MAR-98},
   = {Research Grant},
  source = {IRIS}
}