TY  - CONF
  - O'Sullivan,J.A.;McCarthy,K.G.;Murphy,A.C.;Murphy,P.J.
  - IEEE International Conference on Microelectronic Test Structures (ICMTS)
  - Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz
  - 2005
  - April
  - Published
  - 1
  - ()
  - Schaper,U.;Sansen,W.
  - 119
  - 124
  - Leuven, Belgium
  - 04-APR-05
  - 07-APR-05
  - Enterprise Ireland
DA  - 2005/04
ER  - 

@inproceedings{V379651,
   = {O'Sullivan,J.A. and McCarthy,K.G. and Murphy,A.C. and Murphy,P.J.},
   = {IEEE International Conference on Microelectronic Test Structures (ICMTS)},
   = {{Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz}},
   = {2005},
   = {April},
   = {Published},
   = {1},
   = {()},
   = {Schaper,U. and Sansen,W.},
  pages = {119--124},
   = {Leuven, Belgium},
  month = {Apr},
   = {07-APR-05},
   = {Enterprise Ireland},
  source = {IRIS}
}