IRIS publication 379653
Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard
RIS format for Endnote and similar
TY - CONF - O'Sullivan,J.A.;McCarthy,K.G.;Murphy,P.J. - IEEE International Conference on Microelectronic Test Structures (ICMTS) - Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard - 2006 - March - Published - 1 - () - Austin, USA - 06-MAR-06 - 09-MAR-06 - Enterprise Ireland DA - 2006/03 ER -
BIBTeX format for JabRef and similar
@inproceedings{V379653,
= {O'Sullivan,J.A. and McCarthy,K.G. and Murphy,P.J.},
= {IEEE International Conference on Microelectronic Test Structures (ICMTS)},
= {{Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard}},
= {2006},
= {March},
= {Published},
= {1},
= {()},
= {Austin, USA},
month = {Mar},
= {09-MAR-06},
= {Enterprise Ireland},
source = {IRIS}
}Data as stored in IRIS
| AUTHORS | O'Sullivan,J.A.;McCarthy,K.G.;Murphy,P.J. | ||
| TITLE | IEEE International Conference on Microelectronic Test Structures (ICMTS) | ||
| PUBLICATION_NAME | Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard | ||
| YEAR | 2006 | ||
| MONTH | March | ||
| STATUS | Published | ||
| PEER_REVIEW | 1 | ||
| TIMES_CITED | () | ||
| SEARCH_KEYWORD | |||
| EDITORS | * | ||
| START_PAGE | * | ||
| END_PAGE | * | ||
| LOCATION | Austin, USA | ||
| START_DATE | 06-MAR-06 | ||
| END_DATE | 09-MAR-06 | ||
| ABSTRACT | |||
| FUNDED_BY | Enterprise Ireland | ||
| URL | |||
| DOI_LINK | |||
| FUNDING_BODY | |||
| GRANT_DETAILS |