TY  - CONF
  - Chen, W., McCarthy, K.G., Mathewson, a.
  - International Conference on Ph.D. Research in Microelectronics ; Electronics (PRIME)
  - SEnsitivity Analysis and Fine Tuning of EM Simulations for Transmission Line Characterization
  - 2009
  - July
  - Validated
  - 1
  - ()
  - 260
  - 263
  - Cork
  - 12-JUL-09
  - 17-JUL-09
DA  - 2009/07
ER  - 

@inproceedings{V68097280,
   = {Chen,  W. and  McCarthy,  K.G. and  Mathewson,  a. },
   = {International Conference on Ph.D. Research in Microelectronics ; Electronics (PRIME)},
   = {{SEnsitivity Analysis and Fine Tuning of EM Simulations for Transmission Line Characterization}},
   = {2009},
   = {July},
   = {Validated},
   = {1},
   = {()},
  pages = {260--263},
   = {Cork},
  month = {Jul},
   = {17-JUL-09},
  source = {IRIS}
}