IRIS publication 68097286
Practical Considerations for Measurement of Test Structures for Dielectric Characterization
RIS format for Endnote and similar
TY - CONF - Chen, W., McCarthy, K.G., Mathewson, A. - IEEE International Conference on Microelectronic Test Structures - Practical Considerations for Measurement of Test Structures for Dielectric Characterization - 2009 - April - Validated - 1 - () - 221 - 225 - Oxnard - 30-MAR-09 - 02-APR-09 DA - 2009/04 ER -
BIBTeX format for JabRef and similar
@inproceedings{V68097286, = {Chen, W. and McCarthy, K.G. and Mathewson, A. }, = {IEEE International Conference on Microelectronic Test Structures}, = {{Practical Considerations for Measurement of Test Structures for Dielectric Characterization}}, = {2009}, = {April}, = {Validated}, = {1}, = {()}, pages = {221--225}, = {Oxnard}, month = {Mar}, = {02-APR-09}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Chen, W., McCarthy, K.G., Mathewson, A. | ||
TITLE | IEEE International Conference on Microelectronic Test Structures | ||
PUBLICATION_NAME | Practical Considerations for Measurement of Test Structures for Dielectric Characterization | ||
YEAR | 2009 | ||
MONTH | April | ||
STATUS | Validated | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
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START_PAGE | 221 | ||
END_PAGE | 225 | ||
LOCATION | Oxnard | ||
START_DATE | 30-MAR-09 | ||
END_DATE | 02-APR-09 | ||
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