TY  - CONF
  - Chen, W., O'Sullivan, J.A., McCarthy, K.G.
  - IET China-Ireland International Conference on Information and Communications Technologies (CIICT)
  - Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques
  - 2008
  - September
  - Validated
  - 1
  - ()
  - 631
  - 634
  - Beijing
  - 26-SEP-08
  - 30-SEP-08
DA  - 2008/09
ER  - 

@inproceedings{V68097302,
   = {Chen,  W. and  O'Sullivan,  J.A. and  McCarthy,  K.G. },
   = {IET China-Ireland International Conference on Information and Communications Technologies (CIICT)},
   = {{Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques}},
   = {2008},
   = {September},
   = {Validated},
   = {1},
   = {()},
  pages = {631--634},
   = {Beijing},
  month = {Sep},
   = {30-SEP-08},
  source = {IRIS}
}