Validation of The Sub-Circuit Modelling Approach For Substrate Resistance In 0.13 Mu M Rf Mosfets

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TY  - JOUR
  - Carbajo, A, McCarthy, KG
  - 2007
  - May
  - Analog Integrated Circuits and Signal Processing
  - Validation of The Sub-Circuit Modelling Approach For Substrate Resistance In 0.13 Mu M Rf Mosfets
  - Validated
  - ()
  - 51
  - 2
  - 73
  - 79
  - Great progress has been made on modelling the behaviour of deep-submicron MOS devices, especially concentrating on the performance and operation of the intrinsic device structures. To properly represent the RF performance of these devices, the extrinsic structure must also be considered and a variety of sub-circuit configurations, especially for the substrate, have been proposed. As the frequency of operation rises, it may be expected that more elaborate multi-element substrate sub-circuits will become necessary. Here, we consider the RF operation of advanced 0.13 mu m NMOS transistors up to 10 GHz and demonstrate that a simple sub-circuit, using only a single resistor, allows accurate simulation of the two-port parameters, including y(22). We thus demonstrate that the single-resistor substrate sub-circuit approach remains a simple, yet valid, modelling option for MOS simulation up to 10 GHz..
  - DOI 10.1007/s10470-007-9034-z
DA  - 2007/05
ER  - 
@article{V726803,
   = {Carbajo,  A and  McCarthy,  KG },
   = {2007},
   = {May},
   = {Analog Integrated Circuits and Signal Processing},
   = {Validation of The Sub-Circuit Modelling Approach For Substrate Resistance In 0.13 Mu M Rf Mosfets},
   = {Validated},
   = {()},
   = {51},
   = {2},
  pages = {73--79},
   = {{Great progress has been made on modelling the behaviour of deep-submicron MOS devices, especially concentrating on the performance and operation of the intrinsic device structures. To properly represent the RF performance of these devices, the extrinsic structure must also be considered and a variety of sub-circuit configurations, especially for the substrate, have been proposed. As the frequency of operation rises, it may be expected that more elaborate multi-element substrate sub-circuits will become necessary. Here, we consider the RF operation of advanced 0.13 mu m NMOS transistors up to 10 GHz and demonstrate that a simple sub-circuit, using only a single resistor, allows accurate simulation of the two-port parameters, including y(22). We thus demonstrate that the single-resistor substrate sub-circuit approach remains a simple, yet valid, modelling option for MOS simulation up to 10 GHz..}},
   = {DOI 10.1007/s10470-007-9034-z},
  source = {IRIS}
}
AUTHORSCarbajo, A, McCarthy, KG
YEAR2007
MONTHMay
JOURNAL_CODEAnalog Integrated Circuits and Signal Processing
TITLEValidation of The Sub-Circuit Modelling Approach For Substrate Resistance In 0.13 Mu M Rf Mosfets
STATUSValidated
TIMES_CITED()
SEARCH_KEYWORD
VOLUME51
ISSUE2
START_PAGE73
END_PAGE79
ABSTRACTGreat progress has been made on modelling the behaviour of deep-submicron MOS devices, especially concentrating on the performance and operation of the intrinsic device structures. To properly represent the RF performance of these devices, the extrinsic structure must also be considered and a variety of sub-circuit configurations, especially for the substrate, have been proposed. As the frequency of operation rises, it may be expected that more elaborate multi-element substrate sub-circuits will become necessary. Here, we consider the RF operation of advanced 0.13 mu m NMOS transistors up to 10 GHz and demonstrate that a simple sub-circuit, using only a single resistor, allows accurate simulation of the two-port parameters, including y(22). We thus demonstrate that the single-resistor substrate sub-circuit approach remains a simple, yet valid, modelling option for MOS simulation up to 10 GHz..
PUBLISHER_LOCATION
ISBN_ISSN
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DOI_LINKDOI 10.1007/s10470-007-9034-z
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