TY  - 
  - Other
  - O'Sullivan, JA, McCarthy, KG, Murphy, PJ
  - 2006
  - June
  - Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard
  - Validated
  - 1
  - ()
  - Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations..
  - 59
  - 64
DA  - 2006/06
ER  - 

@misc{V728421,
   = {Other},
   = {O'Sullivan,  JA and  McCarthy,  KG and  Murphy,  PJ },
   = {2006},
   = {June},
   = {Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard},
   = {Validated},
   = {1},
   = {()},
   = {{Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations..}},
  pages = {59--64},
  source = {IRIS}
}